Back Scattered Electron Test Specimens

Marsoni

M251S

$3274.13

Get it in 3 business days with 1 day shipping. Friday, May 29

Back Scattered Electron Test SpecimensBSE Atomic Reference Specimen Electron micrograph of the nickel copper backscattered electron reference specimen. BSE image at low magnification. The contrast difference between the two wires is visible due to the atomic number difference between the nickel copper. An electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z)

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Reviewed in the United States on March 6, 2025